DOIONLINE 
DOIONLINE Publish In |
International Journal of Industrial Electronics and Electrical Engineering (IJIEEE)-IJIEEE |
 Journal Home Volume Issue |
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Issue |
Volume-5,Issue-3 ( Mar, 2017 ) | |||||||||
Paper Title |
The Effect of Thickness and Extracting Technique for Dielectric Properties | |||||||||
Author Name |
Turgut Ozturk, Muhammet Tahir Guneser | |||||||||
Affilition |
Department of Electrical-Electronics Engineering, Karabuk University, Turkey | |||||||||
Pages |
5-9 | |||||||||
Abstract |
The differences between extracting and measurement methods are presented which are used at millimeter wave frequency band (Ka and W bands), in this study. The common using measurement methods (Free Space Measurement, Waveguide, Coaxial Probe, and Resonant Cavity) are described with their features. In addition, the advantage of Newton-Raphson extracting technique is presented. Furthermore, the thickness effect is showed in process of obtaining the dielectric constant at Ka-band. Index Terms—Dielectric constant, free space measurement, genetic algorithm, newton-raphson method. | |||||||||
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