DOIONLINE 
DOIONLINE Publish In |
International Journal of Industrial Electronics and Electrical Engineering (IJIEEE)-IJIEEE |
 Journal Home Volume Issue |
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Issue |
Volume-7,Issue-11 ( Nov, 2019 ) | |||||||||
Paper Title |
Statistical Description of RCS using Probability Density Function | |||||||||
Author Name |
G.V. Sai Swetha, A. Nagajyothi, T. Pavani | |||||||||
Affilition |
ECE, VIIT, Visakhapatnam, India ECE, VIIT, Visakhapatnam, India ECE, GRIET, Hyderabad, India | |||||||||
Pages |
40-42 | |||||||||
Abstract |
The Radar Cross Section (RCS) of a target is not a constant. In general RCS is a complex function of frequency, polarization, aspect angle. These should be considered for a simple scatterer also, in this paper the main focus is on the demonstration of RCS of a target modelled as a set of many individual point scatterers which is a function of aspect angle, frequency. The behaviour of a complex target leads to use a statistical description for RCS. The RCS of the scatterers within a single resolution cell is considered to be a random variable with a Probability Description Function (PDF). The results of the same were generated in Matlab. Finally the decorrelation in frequency for a fixed aspect angle is shown and found to match with predicted values of Δθ and ΔF. Keywords - Radar Cross Section, Scatterer, Probability Density function, Correlation, Histogram | |||||||||
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