DOIONLINE 
DOIONLINE Publish In |
International Journal of Electrical, Electronics and Data Communication (IJEEDC)-IJEEDC |
 Journal Home Volume Issue |
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Issue |
Volume-2,Issue-7 ( Jul, 2014 ) | |||||||||
Paper Title |
Design Of An Automated Reflection Ellipsometry Setup For Determining Complex Permittivity Of Materials In Microwave Band | |||||||||
Author Name |
Ashok Kumar A, Surya Prakash P, Ragavendra M S, Raakeshcharan A, Santosh Aditya S, Jayakumar M | |||||||||
Affilition |
Applied Electromagnetics Research Group, Department of Electronics & Communication Engineering, Amrita Viswha Vidyapeetham, Coimbatore, India | |||||||||
Pages |
41-44 | |||||||||
Abstract |
This paper deals with an automated setup dedicated for characterization of dielectric properties of materials at microwave frequencies based on the reflection Ellipsometry technique. This instrumentation presents itself as an alternate and inexpensive choice to a vector network analyser. The complex permittivity of a soda lime glass sheet was measured. Interfaces involved in the automation of the Ellipsometry setup are briefly discussed. The numerical approach for determining the complex permittivity is also discussed. | |||||||||
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