DOIONLINE 
DOIONLINE Publish In |
International Journal of Electrical, Electronics and Data Communication (IJEEDC)-IJEEDC |
 Journal Home Volume Issue |
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Issue |
Volume-3, Issue-5 ( May, 2015 ) | |||||||||
Paper Title |
FPGA Based Digital IC Tester | |||||||||
Author Name |
Sandhya Singh Tripaliya, P.P. Bansod | |||||||||
Affilition |
Student, E&I Department, SGSITS Indore HOD, Biomedical Engineering Department, SGSITS Indore | |||||||||
Pages |
87-90 | |||||||||
Abstract |
This paper describes the implementation of testing of CMOS digital integrated circuits for both functional and delay fault testing using reconfigurable field programmable gate array, XC3S500E. This FPGA is interfaced with LCD and hex keypad, has created a very comfortable environment for CMOS digital integrated circuits testing. Tester has generated and applied test vectors for functional and delay fault testing for particular CMOS ICs and check responses with according to particular Gate response. After that, it can declare that CMOS ICs have any functional and delay fault or not. This reconfigurable FPGA based digital IC tester has many advantages over conventional IC testing using automatic test equipments. Keywords— DUT, FPGA, ATEs. | |||||||||
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